Used ACCRETECH / TSK UF 200SA #9235925 for sale

ACCRETECH / TSK UF 200SA is a fully automated and programmable surface prober for testing the electrical and mechanical characteristics of a variety of semiconductor device surfaces and interfaces. TSK UF200SA is the ideal prober for industrial, automotive, aerospace and research applications. ACCRETECH UF 200 SA is built with a compact design and features a tight mechanical platform for increased accuracy and repeatability of measurements. The high-precision CNC machine utilizes advanced Z-axis technology, allowing for greater flexibility in the probing and testing process. The prober has a 7-inch touchscreen display with full graphic interfaces, providing easy access to data and real time process feedback. The prober is equipped with the latest TSK control equipment, permitting the user to control multiple probers remotely and concurrently without confusions or interference. The control system also allows the user to set up and store testing protocols, ensuring faster and more efficient operation. The machine also has a built-in break-in detection capability that prevents accidental contact with the device's surface. For maximum accuracy, ACCRETECH UF 200SA offers a variety of measurement mechanisms, including stencil framework alignment, depth gauge, optical microscope, and automated surface parameters detection. The prober also includes a wide variety of probers, needle probes, contact fingers, scanning probes and custom probes, enabling the user to properly test a variety of wafer sizes. TSK UF 200SA is also equipped with a vacuum unit for accurate testing, enabling straight-outtest performance. This vacuum machine can also be used to reduce tester backlash and determines contact force for accurate and repeatable testing processes. ACCRETECH / TSK UF200SA is an efficient, reliable and flexible prober, ideal for testing and reverse engineering applications. With its compact design, advanced features, and customizable options, this prober is the perfect tool for making accurate surface and interface measurements on a variety of devices.