Used ACCRETECH / TSK UF 200SA #9235929 for sale

ACCRETECH / TSK UF 200SA is a prober used to conduct wafer testing and analysis. It is a next-generation design that has been created to meet the demands of high-end research, development and production facilities.TSK UF200SA is a multi-purpose metrology tool with the ability to deliver precise measurements over an extended testing range. This product can be used for nanometer-level measurements of various processes, such as Cantilever Vacuum Probes (CVP's), parametric test and residual gas analysis (RGA's). It is designed to work in cleanroom environments and is engineered for extended operation within a wide temperature range, from -40C to +85C. ACCRETECH UF 200 SA features a fully automated wafer handling mechanism that provides accurate registration and positioning of wafer on the wafer prober stage. The automated wafer handler equipment comes with a unique Load Port Unit (LPU) which helps to reduce the chance of particle damage. Additionally, TSK UF 200SA's automated system offers high repeatability in measuring performance. The instrument also includes a Scanning Probe Microscope (SPM) solution that offers a variety of nanotechnology automation. The ProTector™ solution, a multi-purpose nanotechnology automation unit, can be used for field testing and defect analysis operations. The ProTector™ machine comes with built-in modules such as a remote SPM operation, autonomous scanning, and test automation. All of these features enable users to maximize the throughput and efficiency of their nanotechnology operation. ACCRETECH / TSK UF200SA also features a high-resolution vision tool that helps the user to identify the actual shape and size of wafers with extreme accuracy. The high-resolution vision asset gives the user contactless access to the wafer surface which allows them to take pulsed measurements across the full range of wafer dimensions without making physical contact. ACCRETECH UF 200SA provides a full suite of analytic tools, including CVP patterns and various spectrometers for characterization and parametric testing. UF 200SA is a high-precision prober that can be used for a variety of testing and analysis in cleanroom and laboratory environments. The automated wafer handling mechanism provides precise registration and positioning of wafers and the Scanning Probe Microscope (SPM) solution offers a variety of nanotechnology automation features. The ProTector™ solution, along with the high-resolution vision model, lets users take accurate measurements without making contact with the wafer. The instrument also comes with various analytical tools for various tests, including CVP patterns and various spectrometers for characterization and parametric testing.