Used ACCRETECH / TSK UF 200SA #9235934 for sale

ACCRETECH / TSK UF 200SA is a full-featured prober designed to offer high-precision probing of semiconductor devices in academic and industrial applications. The equipment is engineered to investigate a variety of materials ranging from silicon wafers to advanced 3D structures, including integrated circuit designs and MEMS sensors. The prober is equipped with a wide variety of probing, testing, and analysis capabilities to cover the entire testing process from development to production. The prober is comprised of a high-precision probe positioning system, an x-y stage for alignment, and a motorized z stage for post-processing. This unit is supported by powerful software that features statistical data analysis and test pattern generation, as well as CAD database management, design optimization, and automated testing. The machine offers automated wafer alignment and probing with an accuracy of up to 100 nanometers, and a movable working area with a total of 238 x 46 mm. The prober also offers a variety of features for optimal performance. These include a built-in multi-programmable sampling memory, automatic individual-die dynamic compensation and linearity corrections, automatic scratch detection, and automatic pass/fail analysis. Furthermore, it has integrated wide-area omni-directional alignment lens and a wide-area laser probing tool toallow quick and accurate testing of wafers up to 10 inches in diameter. TSK UF200SA is well-suited for metalization studies, active device characterization, die-level leakage current measurements, and a variety of semiconductor device testing and analysis tasks. It provides users with high-precision probing and testing, fast alignment, and excellent repeatability for accurate data acquisition. Furthermore, its modular design makes it easy to configure and can be easily expanded to meet changing requirements.