Used ACCRETECH / TSK UF 200SA #9235935 for sale

ACCRETECH / TSK UF 200SA is a semiconductor prober that is designed for wafer level testing and final test applications. It is capable of executing a variety of test parameters, including current, voltage, capacitance, and on-off current. This robust tool offers a wide range of automation options, including full manual control, automated scanning, and event recognition. TSK UF200SA prober has a tested capacity of up to 200mm (compared to the UF 150SA) and a programmable z axis that allows for high precision wafer level testing. In addition, the prober is designed with a low voltage optical encoder, reducing the cost and complexity of incremental motion. It is also equipped with an intuitive user interface, allowing for quick and easy setup of wafer tests and test parameters. The prober is capable of performing tests on reverse-side transistors, resistors, and capacitors, along with other two-dimensional and three-dimensional structures. The advanced contact vision system provides accurate alignment as well as a reliable contact force. The probers accuracy of 0.2 microns coupled with its patented design of offsetting contact pads ensure a reliable contact each time. In addition, ACCRETECH UF 200 SA prober boasts a variety of smart test functions, including the "Smart Attitude Console". This feature enables the user to adjust prober parameters remotely and detect prober errors quickly. Furthermore, the prober can run different test configurations from a single prober setup, allowing users to increase throughput on multiple test types with minimal setup effort. ACCRETECH UF200SA prober offers a range of features that benefit users in semiconductor manufacturing, as well as R&D applications. With this prober, users can minimize contact force, minimize contact volume, and execute asymmetric contact by adjusting contact pads patterns. It also supports the Inter-IC (I2C) protocol, offering communication compatibility with other peripherals. Overall, TSK UF 200SA is an advanced prober that offers users the ultimate in flexibility and efficiency. It is ideal for wafer level testing and final test applications, with the capability to execute a variety of tests, including current, voltage, capacitance, and on-off current. In addition, it offers smart test functions and a low voltage optical encoder, and is compatible with multiple peripheral devices.