Used ACCRETECH / TSK UF 200SA #9274669 for sale

ACCRETECH / TSK UF 200SA is a prober designed to analyze and measure electrical characteristics of semiconductor devices. It is equipped with a layer to layer measuring equipment that utilizes a variety of different probes with a high accuracy measuring system. This prober is capable of making measurements on various samples ranging from semiconductor components, complex assemblies, dies, bumps, and packages. The prober consists of several different parts that work together to achieve the desired result. At the heart of the unit is TSK UF200SA prober, which includes two positioning drives that allow for accurate x and y movement of the probe head over the sample. Additionally, the prober includes a high-frequency measurement machine that utilizes AC and DC current, voltage, and resistance measurements in order to detect small deviations in electrical characteristics for the sample. ACCRETECH UF 200 SA prober also includes an expansive library of probe and tip selections that allow for a range of probing options. Whether measuring a single layer, multiple layers, bumps, or packages, the prober includes a wide selection of probes and tips to ensure a successful analysis. The probe holds and can lift the test probes from the sample without the need of a manual manipulation. This multiple tip loading technique makes it possible to measure an array up to 200 device patterns without increasing the amount of time and effort to reposition the test pins. The prober also features an integrated vision tool that allows for a smooth and accurate alignment of test probes to matching sites. The asset uses a CCD camera to identify the sample by imaging each device pad and matching the image to the prober's library. The CAD samples can be easily loaded and modified in the prober's software. Additionally, the integrated imaging model can also inspect and detect defects over a large area by comparing the CCD images to a reference sample. Finally, UF 200SA also includes a flexible software platform to create test data, analyze and store data, and evaluate results quickly and efficiently. The software is compatible with various software packages that can be used to analyze, model, and report test results. Additionally, the user can connect to an external computer, allowing for further analysis of data. UF200SA is a highly accurate and versatile prober that is designed to measure electrical characteristics of semiconductor devices. The wide selection of probes, tips, and vision equipment, coupled with the powerful software platform, ensure a successful analysis and repeatable, accurate test data every time.