Used ACCRETECH / TSK UF 200SA #9283881 for sale

ACCRETECH / TSK UF 200SA is a top-of-the-line semiconductor prober designed to operate at speeds up to 200mm/sec to accurately and reliably test and measure wafers and bonds. It features an advanced high-precision integrated prober and tester solution, offering enhanced sampling speed, accuracy and performance for high-performance probing and testing. TSK UF200SA equipment is made up of a mainframe, electrical unit, and microscope system. The mainframe is a dynamic precision-controlled X-Y-Z core unit equipped with a high-speed 27-bit DC motor, which supports dynamic movement up to 200mm/s for high-speed probing. The machine is also equipped with an automatic Z-axis crash detection feature, which can detect and stop probing operations when an electrical short occurs. The Z-axis has continuous feedback, offering precise control and accuracy to avoid physical damage to the device under test. The electrical unit is the key component of ACCRETECH UF 200 SA, providing stable, reliable operation. It is coupled with an amplifier unit, power limit circuitry, and mesa-type guards to ensure reliable operation. It provides adjustable amplitude, bias voltage, and current conditions in various frequency ranges and power levels. The unit also wields a variety of control settings such as auto-calibration of amplifiers and parameters. The microscope tool is the third major component of TSK UF 200SA. This device is composed of a asset of lenses and electro-optic elements with a superior image resolution. It can be used to directly check wafer surfaces, allowing accurate alignment and checking of the position of probes and the physical condition of contacts. The microscope also features an auto-focus model, fluorescent china option, and dual-view analysis. UF 200SA is an advanced and comprehensive prober that has multiple performance advantages over conventional systems. It provides a reliable, versatile solution for wide-ranging applications. It offers precision, the ability to process large numbers of samples, improved speed and performance, easy configuration, and advanced features for optimal device testing.