Used ACCRETECH / TSK UF 200SA #9283882 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200SA
ID: 9283882
Vintage: 2005
Prober Platform: J750 / J750EX Floppy Disk Drive (FDD) Magneto Optical (MO) Disk Hard Disk Drive (HDD) Control rack: Z-Axis driver XY Servo drivers Power control board Video interface board Power supply: (2) 24 V, 12 V, -12 V, 5 V, 48 V VME Rack: Slot / Board Slot 1 / Master CPU Slot 4 / VGA Card Slot 5 / VGA Card Slot 6 / COGNEX Board Slot 8 / PIO Board Slot 10 / GPIB Board Slot 11 / 5-Channel PGEN board Slot 13 / - Slot 14 / DISP Sensor Slot 15 / - Slot 16 / Slave CPU Slot 17 / Loader I/O Slot 18 / Loader PGEN Read side: Driver board F-Server driver Theta server driver (2) Fans Loader side: Loader driver board OCR Camera Loader sensor board Loader axis board Cassette cover Elevator motor driver Sub-chuck rotation motor driver Turntable motor driver (2) Transfer motor driver arms Pre-alignment sensor (2) Arms Sub-chuck Inspection tray Temperature controller Elevator / Clamper Chuck top Z-Unit (2) XY Axis screw and motors F-Axis screw E1, E2 Camera module Touch panel Keyboard and joystick Keyboard control board Alarm lamp pole Hinge: 300L Miscellaneous: Free stopper (Cassette cover) Valve Tie rod for loader / Main body 2005 vintage.
TSK/Tsubaki-UFS 200SA Prober is an industry-leading automated laser interferometer prober utilized for electrical and mechanical measurements. This equipment is designed with a high-resolution measuring head featuring an extra-low Z-axis profile, offering superior accuracy and precision for testing and measuring semiconductor wafers and related components. ACCRETECH / TSK UF 200SA Prober utilizes high-accuracy laser interferometers to measure the smallest variations in semiconductor wafer thickness, flatness, planarity, and bow with superior accuracy and precision. This system is also equipped with a novel three-dimensional alignment technology and multiple drive unit, allowing it to measure with high accuracy and repeatability on a variety of substrates and semiconductor wafers. Additionally, its integral autofocus machine allows users to measure small details of the wafer surface with high accuracy and repeatability. TSK UF200SA Prober has a small footprint, making it ideal for use in crowded lab environments. It also features a total of eight incremental encoders, giving it the ability to sense wafer misalignment and self-calibrate to ensure the highest accuracy and repeatability from sample to sample. Additionally, this tool provides an integrated auto-calibrate feature which helps ensure high accuracy of measurements of the interconnected and misaligned devices, as well as features a wide mechanical range and increased speed of operation. ACCRETECH UF 200 SA Prober is equipped with multiple software packages for efficient operation, including high-precision tolerancing, wafer thinning, and wafer-warping correction software to ensure high accuracy readings. These software packages allow the prober to adjust to changing samples and conditions automatically and accurately, greatly increasing precision and repeatability. UF 200 SA Prober is a powerful tool for semiconductor manufacturing, offering users industry leading accuracy and repeatability with a small footprint, making it an ideal choice for demanding laboratories. Compact and reliable, it is perfect for both high-precision and quick measurements, offering exceptional performance and efficiency.
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