Used ACCRETECH / TSK UF 200SA #9283882 for sale
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ID: 9283882
Vintage: 2005
Prober
Platform: J750 / J750EX
Floppy Disk Drive (FDD)
Magneto Optical (MO) Disk
Hard Disk Drive (HDD)
Control rack:
Z-Axis driver
XY Servo drivers
Power control board
Video interface board
Power supply: (2) 24 V, 12 V, -12 V, 5 V, 48 V
VME Rack:
Slot / Board
Slot 1 / Master CPU
Slot 4 / VGA Card
Slot 5 / VGA Card
Slot 6 / COGNEX Board
Slot 8 / PIO Board
Slot 10 / GPIB Board
Slot 11 / 5-Channel PGEN board
Slot 13 / -
Slot 14 / DISP Sensor
Slot 15 / -
Slot 16 / Slave CPU
Slot 17 / Loader I/O
Slot 18 / Loader PGEN
Read side:
Driver board
F-Server driver
Theta server driver
(2) Fans
Loader side:
Loader driver board
OCR Camera
Loader sensor board
Loader axis board
Cassette cover
Elevator motor driver
Sub-chuck rotation motor driver
Turntable motor driver
(2) Transfer motor driver arms
Pre-alignment sensor
(2) Arms
Sub-chuck
Inspection tray
Temperature controller
Elevator / Clamper
Chuck top
Z-Unit
(2) XY Axis screw and motors
F-Axis screw
E1, E2 Camera module
Touch panel
Keyboard and joystick
Keyboard control board
Alarm lamp pole
Hinge: 300L
Miscellaneous:
Free stopper (Cassette cover)
Valve
Tie rod for loader / Main body
2005 vintage.
TSK/Tsubaki-UFS 200SA Prober is an industry-leading automated laser interferometer prober utilized for electrical and mechanical measurements. This equipment is designed with a high-resolution measuring head featuring an extra-low Z-axis profile, offering superior accuracy and precision for testing and measuring semiconductor wafers and related components. ACCRETECH / TSK UF 200SA Prober utilizes high-accuracy laser interferometers to measure the smallest variations in semiconductor wafer thickness, flatness, planarity, and bow with superior accuracy and precision. This system is also equipped with a novel three-dimensional alignment technology and multiple drive unit, allowing it to measure with high accuracy and repeatability on a variety of substrates and semiconductor wafers. Additionally, its integral autofocus machine allows users to measure small details of the wafer surface with high accuracy and repeatability. TSK UF200SA Prober has a small footprint, making it ideal for use in crowded lab environments. It also features a total of eight incremental encoders, giving it the ability to sense wafer misalignment and self-calibrate to ensure the highest accuracy and repeatability from sample to sample. Additionally, this tool provides an integrated auto-calibrate feature which helps ensure high accuracy of measurements of the interconnected and misaligned devices, as well as features a wide mechanical range and increased speed of operation. ACCRETECH UF 200 SA Prober is equipped with multiple software packages for efficient operation, including high-precision tolerancing, wafer thinning, and wafer-warping correction software to ensure high accuracy readings. These software packages allow the prober to adjust to changing samples and conditions automatically and accurately, greatly increasing precision and repeatability. UF 200 SA Prober is a powerful tool for semiconductor manufacturing, offering users industry leading accuracy and repeatability with a small footprint, making it an ideal choice for demanding laboratories. Compact and reliable, it is perfect for both high-precision and quick measurements, offering exceptional performance and efficiency.
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