Used ACCRETECH / TSK UF 200SA #9283883 for sale

ACCRETECH / TSK UF 200SA is a prober designed for use in semiconductor device, interconnect and metrology applications. This probing equipment provides a high level of precision and throughput for accurate, reliable and repeatable measurements up to 200 W. It is suitable for testing a variety of semiconductor components, including transistors, resistors, capacitors, diode and other materials, as well as for interconnects. TSK UF200SA prober features a 6-axis stage for performing automated wafer and die alignment, as well as a 24-bit digital image processing system for accurate alignment and registration. This prober offers a wide range of testing applications, including but not limited to: die sorting and testing, parametric measurements, die- and wafer-level inspections, optical inspection, transistor testing and burn-in testing. It also makes use of adaptive force control technology to provide an optimal probing solution for a variety of different materials and applications. ACCRETECH UF 200 SA has an array of testing tools, such as four-wire Kelvin resistance measurement, switch testing, leakage and current testing and contact probing. It features a high-speed contact head and lens, a dynamic focusing unit, as well as a contact force/contact area calculator. This prober also allows users to customize the settings of its software to create programs appropriate for their specific testing requirements. UF200SA also offers a range of standard and high-end accessories and software solutions, including an array of clamp-on and liquid dispense vacuum tools, an array of contact tools, an array of optical tools, and an array of semiconductor testing and measurement systems. Overall, TSK UF 200SA is a precise, flexible and reliable probing machine suitable for a wide range of applications. The wide range of tests, tools, and software solutions available enable users to customize their testing processes, measure and inspect components accurately, and obtain precise and reliable results. With this tool, users can improve test throughput, reduce cost and increase accuracy.