Used ACCRETECH / TSK UF 200SA #9283907 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200SA
ID: 9283907
Vintage: 2006
Prober Platform: J750 / J750 EX OCR Type: Type 4 Chuck Temperature: 30°C - 150°C Tray module: Tray Clean unit, 2" Docking type: J750 Docking kit: TERADYNE K Dock PMI Function: PMI I 2006 vintage.
ACCRETECH / TSK UF 200SA is a high performance, cost-effective 3D non-contact surface and optical prober. It is the ideal tool for a wide range of semiconductor, MEMS, and optoelectronics inspection and metrology applications. TSK UF200SA is designed for complete in-line 3D non-contact measurement of ultra-flat surfaces and high-aspect ratio features. ACCRETECH UF 200 SA has an integrated advanced optics and illumination design that provides superior resolution and accuracy. The near-infrared optics are capable of measuring features with a minimum spot size of 2.5 μm and a repeatability of 0.5 μm or better. It also uses an innovative 3D scanning laser autofocusing, which makes it possible to measure high-aspect ratio and large step heights with high repeatability. ACCRETECH / TSK UF200SA is equipped with a high-speed data acquisition and processing controller. It can capture data points up to 70 times faster than traditional profilers while maintaining an extremely high resolution. The information can be processed further with the built-in profile and line analysis features. The combination of these features gives UF 200 SA the ability to track systems with extremely tight tolerances in a wide range of applications. UF200SA is easy to use and program, and it is compatible with many industry-standard computers and operating systems. It includes an intuitive graphical user interface that allows for the fast and efficient development of automated measurement and analysis programs. ACCRETECH UF200SA is an excellent tool for all your optical profiler needs. With its advanced optics and illumination and fast data acquisition and analysis capabilities, it allows you to capture, measure, and analyze data quickly and easily. Its built-in profile and line analysis capabilities make it the perfect tool for precise, non-contact surface and optoelectronics inspections and metrology applications.
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