Used ACCRETECH / TSK UF 200SA #9314157 for sale

ACCRETECH / TSK UF 200SA
Manufacturer
ACCRETECH / TSK
Model
UF 200SA
ID: 9314157
Vintage: 2003
Probers With hot chuck Chuck type: Gold Wide polish pad: Ceramic pad Manipulator: MHF 300L Motor type: APC Probe card holder TFT LCD Color display, 10.4" No OCR VME Rack / Board name / Description 1 / Master CPU / ADVME 7507 4 / VGAC2 / - 6 / ITV / COGNEX 8200 8 / PIO / - 10 / GPIB / - 11 / (5) PGEN / - 13 / Slave CPU / AVME-344A 14 / Capacitive sensor / - 16 / LD I/O-1 / AVME-115B 17 / LD PGEN-1 / - 18 / PI IO / - 2003 vintage.
ACCRETECH / TSK UF 200SA is a metrology prober designed to perform accurate and precise non-contact measurements of semiconductor materials and devices as small as 150 nanometers. This prober combines a unique combination of high speed and outstanding accuracy in both height and planarity scanning. TSK UF200SA has been designed to meet the critical requirements of semiconductor yield improvement and reliability monitoring. The prober has a flexible design that can be used with a variety of substrates and devices. ACCRETECH UF 200 SA features an industrial-grade, oil-free air bearing system, which delivers fast and accurate positioning of the probe tip over 200,000 times/sec inwards and outwards. The in/out movement of the probe is controllable in 20 nanometer increments with a total travel range of 0.2mm. This enables the prober to accurately measure the 3D shape and surfaces of the substrates and devices without the need for contact. UF 200SA prober is equipped with a CCD camera, which is used to locate landmarks on the substrate and accurately position the probe tip. The camera has a resolution of 3.2 μm/pixel, which is capable of recognizing and measuring very small details in the surface of the substrate. Interference imaging technology (IFI) is used to measure and analyze the 3D shape of the substrate, enabling the accurate determination of surface roughness. UF200SA is equipped with a variety of software features which allows for the precise measurement of various semiconductor related characteristics, such as coplanarity, profiling, vibration analysis, alignment, tilt, and distortion. The prober also features an automatic calibration and alignment function to ensure precise measurements. Other features include real-time data collection, real-time display, and data analysis capabilities. TSK UF 200 SA provides a high-speed, precise, and reliable solution for measuring the physical characteristics of semiconductor materials and devices. It is highly supported by powerful and versatile software applications, allowing for quick measurement and analysis of the substrates and devices. ACCRETECH UF 200SA prober is used in many industries, including semiconductor production, automotive, optical fiber industries, and more.
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