Used ACCRETECH / TSK UF 200SA #9314178 for sale

ACCRETECH / TSK UF 200SA is a prober that facilitates efficient and precise non-contact measurements of wafer samples using scanning acoustic microscopy. It offers measurement capabilities with accuracy of up to 0.01 microns, capable of precise automated non-contact wafer mapping of ultrasound images. The prober offers a unique and versatile architecture that is easy to use and maintain. Its user-friendly touchscreen interface allows intuitive operation. TSK UF200SA also offers precise, programmable sample and probe positioning, allowing precise accuracy and repeatability in measurements. It is equipped with an advanced, closed-loop, automated sample and specimen mechanism, allowing precise location of samples and probes with repeatable accuracy. ACCRETECH UF 200 SA has a wide variety of measurement capabilities, including automated sampling and tuning, wafer mapping and defect mapping, overlay measurement, and measurement of backside acoustic reflectivity. It has an extended depth of focus, allowing for uniform data collection across its entire field of view. The prober also has an external synchronous pulse output that allows for precise correlation of time in different measurements. ACCRETECH UF 200SA has an embedded controller and signal conditioning system that provides signal stability. Its control signals are generated on-board, and they match the signal characteristics at frequencies ranging from 800MHz to more than 8GHz, providing excellent signal stability and repeatability. Its advanced feature set provides the capability to precisely control the signal conditioning, enabling high-throughput measurement. TSK UF 200SA has an integrated embedded computer, which supports the processors and software needed for data acquisition, analysis and display. The operating system embedded in the prober offers a wide variety of features, including easy programming and a large memory capacity. Furthermore, it offers support for various standard software applications, from image processing to real-time control. TSK UF 200 SA is also equipped with a powerful and reliable hardware platform, providing an excellent operational environment for data acquisition and analysis. It offers high-speed data acquisition and real-time control of the signal conditioning system. It has an Ethernet interface for remote control, a VGA output port for the display of results, and a USB port for data storage. Overall, ACCRETECH / TSK UF200SA is an excellent prober for non-contact measurements of wafer samples. Its easy-to-use interface, advanced signal conditioning, and embedded controller make it a reliable and versatile tool for precise measurements in research, semiconductor, and electronics testing.