Used ACCRETECH / TSK UF 200SA #9384063 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200SA
ID: 9384063
Wafer Size: 6"
Automatic wafer prober, 6".
ACCRETECH / TSK UF 200SA prober is an all-in-one high performance probe station that is designed to handle a wide variety of applications in the semiconductor industry. The equipment consists of a base station, two-axis feedback control and two precision micromanipulators. The base station features three independent control axes, providing precision probing of both large and small substrates. The two-axis feedback control system (X, Y, and Z axes) utilizes advanced simultaneous control technology which minimizes measurement errors due to thermal effects, as well as providing reliable high-precision positioning. This unit is capable of performing probing, mapping and fine pitch probing measurements with precision and consistency. TSK UF200SA also includes a variety of customizable options, such as probe tips, accessories, optics and pneumatic devices for a wide range of probing operations. The machine can be automated for collecting large data sets such as line width data, and enables users to quickly scan large surface areas. The prober features an easy-to-use touchscreen interface, allowing users to quickly configure settings, capture images and store data. ACCRETECH UF 200 SA features an integrated image sensor which integrates measurement data into images for quick visual feedback. This feature also allows users to quickly analyze and compare multiple samples for efficient troubleshooting and diagnostics. The prober also features advanced calibration capabilities which enable accurate and reliable measurements. ACCRETECH UF200SA is optimized for working with challenging substrates such as small packages and components, with options for wafer probers, dual head probing and high-pressure prober systems. ACCRETECH / TSK UF200SA prober is an all-in-one high performance probe station, designed for a wide range of semiconductor applications. The tool is capable of performing probing, mapping and fine pitch probing measurements with precision and consistency, and includes customizable options such as probe tips and accessories as well as an intuitive touchscreen interface and image capture sensor to ensure accurate and reliable measurements.
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