Used ACCRETECH / TSK UF 200SFL #9251038 for sale

ACCRETECH / TSK UF 200SFL is an advanced electron and ion beam prober designed to facilitate failure analysis of semiconductor devices and electro-mechanical assemblies. It is equipped with ultra-high resolution (200 nanometers) imaging capabilities, enabling users to analyze minute features in various types of materials, such as semiconductor ICs, MEMS, optoelectronics, and nanomaterials. TSK UF 200SFL has a scalable stage with a maximum travel range of 100mm x 800mm, providing comprehensive access to large or complex test samples. In addition, the prober is furnished with automated operations and software for sample orientation, optimized replot operations, and enhanced automation programming. ACCRETECH UF 200SFL is fitted with an advanced electron beam gun that enables imaging resolution down to sub-micron level. The gun allows users to select either a thermionic emission or a cold field emission source to generate electron beam signal. The level of resolution is further enhanced by an auto alignment system that can automatically adjust the beam convergence and focus in the sample. The adjustment process is designed to ensure that the beam remains in optimal focus and alignment. Moreover, the gun is shielded with the Bcrak™ electron column, a low voltage, cryopumping, and an acoustic pulse emission system for protection against high-energy particles, ensuring a safe working environment. Furthermore, UF 200SFL's advanced ion beam technology enables etching, ablation, and other surface treatments for small, intricate components in samples. The beam gun is independently adjustable to tailor parameters such as ion beam current and acceleration voltage to precisely control the etch rate and other treatments. As a result, users are able to perform complex treatments and repairs with precision. Equipped with an advanced integrated vision system, ACCRETECH / TSK UF 200SFL provides high-resolution imaging capabilities. Features such as automatic sample recognition, automated feedback control, and integrated control systems simplify user operations while maximizing productivity. In addition, the prober supports enhanced metrology capabilities, such as total ion current detection, precise beam spot alignment, and beam pattern alignment. TSK UF 200SFL is an advanced electron and ion beam prober designed to help users analyze and repair complex structures and electronics. It features ultra-high resolution imaging capabilities, automated operations, and a high level of precision control enabled by its advanced electron and ion beam technologies. By incorporating automated feedback control, integrated control systems, and total ion current detection, ACCRETECH UF 200SFL provides an efficient and accurate platform for failure analysis and device repair.