Used ACCRETECH / TSK UF 300 #293728194 for sale

ACCRETECH / TSK UF 300 is a state-of-the-art prober that is designed to facilitate contact testing, electrical measurement, and imaging applications of thin-film integrated circuits (ICs). It features a unique, modular design that can be easily configured to suit the user's needs. The equipment includes an X-Y-Z stage, high-resolution X-Y axes, four-point contact force control, and a 1.4 megapixel digital imaging system. The X-Y-Z stage is three-axis, manual focus stage that can move the probe at a range of speeds from 0.5 to 1000mm/s and with a resolution of 0.25µm. The high-resolution X-Y axis allows for precision movement of the probe up to ± 6µm with a maximum acceleration of 30cm/s². This allows for accurate probing of fine ICs with minimal wear. TSK UF 300 also features a finely-tuned four-point contact force control unit. This ensures consistent contact between the device under test and the prober with the use of a small force before measurement. Force control tension is adjustable so that it can be adapted to match the specific test requirements. The 1.4 megapixel digital imaging machine on ACCRETECH UF300 incorporates a color CMOS Sensor that can take images in multiple states. The tool includes annotation, zooming and contrast adjustment features to allow for accurate IC identification and analysis. Images can also be connected to external programs or devices for data acquisition, analysis, or archiving. Finally, TSK UF300 asset is built using an IEEE-488 interface for digital communication. This makes it easy to integrate the prober into existing test systems. The model is easy to use and maintain, and it works with Windows and LabView for an effortless user experience. Overall, ACCRETECH / TSK UF300 is an impressive prober that is designed to facilitate contact testing, electrical measurement, and imaging applications of thin-film integrated circuits. Its modular design provides users with the flexibility they need to configure the equipment to meet their specific test requirements. The X-Y-Z stage, high-resolution X-Y axes, four-point contact force control, and 1.4 megapixel digital imaging system ensure accurate and consistent results. ACCRETECH UF 300 also features IEEE-488 integration for digital communication, making it easy to integrate the prober into existing test systems.