Used ACCRETECH / TSK UF 300 #293824747 for sale

ACCRETECH / TSK UF 300 is a wafer prober developed by TSK, a leading wafer probing and debug equipment supplier. This prober is designed to accurately measure and test semiconductor wafers in order to detect and repair any defects, making it an essential component in the semiconductor industry. TSK UF 300 utilizes a stage-less XY-theta positioning system that offers a wafer area of up to 12" (300mm), making it suitable for different wafer sizes. The prober also has the ability to accurately measure each contact point, allowing for precise measurements with few measurement errors. In addition, it features an automated manual stage that can pick up and position multiple probing cards simultaneously, providing a more efficient testing process. Furthermore, the stage has variable speed stepping and tilt control, allowing for precise angle and speed control for greater accuracy. ACCRETECH UF300 uses a linear motor to provide a high speed in X-Y direction, with minimal vibration for a smoother operation. It is also equipped with a TFT LCD display for easy programming, monitoring, and controlling. It is capable of automatically slicing wafers, and it also comes with a built-in barcode reader that can read a variety of barcodes quickly and accurately. Other features include automatic centering alignment and an automated handling tray with a secure feed system to transfer wafers between trays. UF 300 has a fully automated calibration system with an advanced geometry adjustment capabilities that allow for more accurate measurements, even in the complicated structures presented in advanced package tests. In addition, its ability to test multiple devices at once makes it an even more effective and efficient option for testers and developers. Overall, ACCRETECH / TSK UF300 wafer prober is an efficient and reliable tool that can accurately measure and test a variety of semiconductor wafers. Its versatile design prevents ineffective measurement errors, while its advanced features provide a thorough and precise probing process. As such, it is well suited for a range of applications in the semiconductor industry, allowing both developers and testers to confidently produce reliable and consistent results.