Used ACCRETECH / TSK UF 300 #9221039 for sale

ACCRETECH / TSK UF 300 is a prober designed for semiconductor wafer production and testing. It is capable of performing a variety of functions including wafer sample testing, failure analysis, and datalogging. TSK UF 300 has a 10 nanometer accuracy and can support up to 8 wafers simultaneously. The prober has a modular design which allows for easy upgradability as well as the ability to easily customize the prober to suit specific applications. It is also designed for quick turnaround times, with its sub-second post-retrieval speed. ACCRETECH UF300's sample test system is able to perform precise electrical parameter measurements, including resistance, capacitance, inductance, and voltage. It has built-in self-test diagnostics that can detect any electrical faults or anomalies. It also features a wide range of automated operations, such as automatic wafer alignment, wafer probing, data logging, go/no-go test results, and visual inspection. The failure analysis system on the prober is capable of providing a detailed analysis of any faults that may be present on the wafer. Detailed images of the fault are created using the automated CCD camera, which can then be used in further analysis. The prober also has automated defect analysis capabilities, with built-in algorithms for detecting and characterizing various defect types. UF 300 has numerous datalogging and analysis features, enabling the capture and analysis of large amounts of data from the wafer. This data can then be stored for further analysis or used to detect trends or patterns. It also features a built-in scripting tool that can automate certain datalogging operations. ACCRETECH UF 300 is a reliable and versatile prober that is suitable for use in a variety of applications. Its modular design and wide range of features make it very easy to customize and use in various production and testing environments. Its ability to accurately measure various electrical parameters, perform automated wafer probing and analysis, and handle large amounts of data make it an ideal tool in the semiconductor industry.