Used ACCRETECH / TSK UF 300 #9281378 for sale
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ID: 9281378
Vintage: 2001
Prober
Chuck type: Gold
Chuck size: 8"-12"
E2 Camera
Loader
Temperature range: Ambient +150°C
HINGE MHF250 Manipulator
GPIB
Needle alignment
Auto needle height
Auto alignment
XY Position accuracy: ±1µm
No manipulator and inking
No chiller
No docking kit
No head plate
No OCR
No clean pad
2001 vintage.
ACCRETECH / TSK UF 300 prober is a leading-edge semiconductor probing station designed for comprehensive surface analysis. Through a series of precise steps, TSK UF 300 provides high-quality imaging, visualization, and fast measurements of micro-scale and nano-scale structures on the surface of a semiconductor wafer. Spanning a range from low-level electrical measurements to demonstrating light-induced stepping and detection, ACCRETECH UF300 is a powerful prober that enables the most complex strategies and components to be explored. UF 300 boasts a 12 or 14 GHz oscilloscope as a core component of the prober, enabling impedance measurements to be taken with ultra-high resolution. The prober is also optimized for automated operation, featuring a high-performance computing engine for high-speed image processing. Its scanners, including the Passport-VL scanner and the Passport-TW scanner, facilitate enhanced imaging with unprecedented accuracy and faster specimen registration. In addition to prober capability, ACCRETECH / TSK UF300 offers a range of functionalities such as variable ambient temperature control, wider-range wafer stage availability, and an easy-to-use software interface. Its HF error-correcting mechanism, which displays corrective information on a monitor, ensures improved accuracy on fine structures. For the most demanding demands, UF300 also features a variety of automated accessory functions, enabling adaptive probe tests to various process conditions. Automatic focus measurement and calibration functions are available, and ACCRETECH UF 300 can perform LED wafer recognition in a high-speed and high-precision manner. TSK UF300 is the ideal prober solution for research and development teams, allowing for effective quality control of semiconductor production processes as well as providing a variety of imaging, visualization, and analysis capabilities to enable fast testing and measurement of devices. The prober also has remote monitoring capabilities, allowing for operation in harsh environments. Ultimately, ACCRETECH / TSK UF 300 boasts a secure and reliable platform that can be operated through a wide variety of testing applications.
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