Used ACCRETECH / TSK UF 300 #9361380 for sale

ACCRETECH / TSK UF 300
Manufacturer
ACCRETECH / TSK
Model
UF 300
ID: 9361380
Prober.
ACCRETECH / TSK UF 300 prober is a device used by integrated circuit (IC), optoelectronics, and semiconductor manufacturers to measure the electrical properties of ICs with high accuracy and precision. The prober is designed to perform wafer-level parametric tests on devices with sizes ranging from 50 micrometers to 1 millimeter. The prober operates with four main components; a prober platform, a vertical linear motion actuator, a wafer handler, and an integrated measurement system. The prober platform consists of a base plate, raised arm, and X-Y traverse plates, all of which are equipped with precision linear motors and encoders. This platform allows for smooth and precise automatic movements of the user interface (via a joystick) for sample positioning. The vertical linear motion actuator carefully moves the wafer handler to precisely place the wafer on the prober platform. The prober is capable of testing a wide range of device parameters including resistance, capacitance, threshold voltage, semiconductor gain and breakdown voltage. It is also capable of measuring and verifying dielectric constant, frequency response, transduction measurement, noise level, series resistance, and dielectric losses. Additionally, the prober features on-board controlled steps for accuracy and repeatability, and a computer usage interface with a digital display for visual feedback. TSK UF 300 prober is used in conjunction with a variety of testers. It can be used in conjunction with optical scanners, electrical test systems, and specialized testers to increase device detection accuracy. The prober is compatible with a wide array of known testers, and is especially useful in yielding semiconductors and integrated circuits that require high-precision testing for their continued success. The prober also has built-in safety features, providing necessary security and regulatory compliance. Overall, ACCRETECH UF300 prober is a powerful tool for testing ICs and other semiconductor devices. With its array of features, precision, and accuracy, it is ideal for characterizing and verifying the high-precision and reliable electrical connections necessary for integrated circuits. The prober is highly adaptable and combine a variety of testing devices, is supported by a variety of leading test equipment, and features high safety standards, making it the go-to choice for semiconductor manufacturers.
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