Used ACCRETECH / TSK UF 300 #9394788 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 300
ID: 9394788
Vintage: 2000
Prober With 7507A VME rack Hot chuck missing 2000 vintage.
ACCRETECH / TSK UF 300 is a state-of-the-art prober developed for semiconductor testing in high-volume and quality assurance applications. It features a precision stage which provides excellent repeatability and high speed for wafer handling and probing. The prober also incorporates advanced technologies such as high-resolution optical alignment and single-point calibration along with touch arm probing and advanced motorized stage control. TSK UF 300 offers a large, vertical wafer stage which is capable of accommodating wafers up to 300 mm in diameter. The stage is driven by a high-precision servomotor that offers optimal repeatability. The motor is operated through a touch screen controller, which allows users to set and monitor wafer position, speed, and acceleration inputs for error-free sampling. The motorized stage uses a direct drive equipment to reduce power consumption and vibration. It also features a high-speed scanning mechanism that enables wafer probing with high accuracy and reliability. ACCRETECH UF300 incorporates an advanced optical alignment system for precision alignment of wafers under test. It features an automated laser alignment unit for aligning the die center when probing wafers. The laser-sighted stage is controlled by a precision handheld positioning unit, which enables users to accurately determine and adjust the alignment of the sample in the prober. Additionally, the prober utilizes a single-point calibration machine that ensures unidirectional accuracy. ACCRETECH / TSK UF300 is also equipped with touch arm probing for precise testing of wafers. The prober is equipped with several premium touch arms, such as patterned probes, single-goal alignment, and dual-goal probing. The touch arms provide enhanced electrical isolation between the test stones and the wafers, thus preventing ground bounce and electromagnetic interference (EMI). The prober is also enhanced with motorized stage control, which allows users to program and control all aspects of the probing process. This ensures users can easily adjust and modify the test settings to achieve optimal results. In conclusion, UF 300 is a reliable and precise prober specifically designed for high-volume and quality assurance applications. Its advanced motorized stage control, automated optical alignment tool, single-point calibration, and touch arm probing technologies make it an ideal tool for semiconductor testing.
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