Used ACCRETECH / TSK UF 3000+MHF4000 #9279998 for sale

TSK UF 3000+MHF4000 is a prober that is designed to meet demanding needs in precision electronic testing. This prober is made for highly advanced semiconductor wafer and package probing. It features under-lens technology that ensures a flat surface for probing accuracy, as well as an incredibly high drive frequency of 4 GHz that improves data acquisition speed. This prober is capable of testing 4- to 12-inch wafer sizes and can also handle advanced package types such as BGA, CSP and QFN. The prober features 256 parallel measurement channels, making it well-suited for high-throughput applications. This enables simultaneous testing of 8- to 32-packs of devices. It also has the flexibility to accommodate surface-mount devices and up to 50 bond pads on a single DUT. The prober's adjustable beam sensors are capable of accommodating top-down chip designs, and its dynamic zoom enables greater positional accuracy when testing fine-pitch pad structures. When it comes to data acquisition, the prober has the ability to measure eight different electrical parameters simultaneously. These include resistance, capacitance, inductance, resistance-capacitance-combination (RCC), voltage and current. The prober also has a powerful statistical analysis engine that allows users to store, analyse and present data in a number of ways. The prober features a robust industrial PC system which includes an intuitive operator interface, featuring high-speed signal processing and data acquisition capabilities. This ensures reliable operation and reduces complexity. With the inbuilt graphical user interface, users can quickly arrange and manage their tests and data. The prober also has online self-diagnostics, which provide real-time feedback on the individual system parameters so users can be sure of the utmost accuracy. Overall, ACCRETECH UF 3000+MHF4000 is a powerful, versatile prober that provides excellent reliability and accuracy when testing electronic circuits and devices. With its advanced functionality and features, users can enjoy the benefit of a prober that is well-suited to a wide range of testing applications.