Used ACCRETECH / TSK UF 3000+MHF4000 #9280000 for sale
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ID: 9280000
Vintage: 2007
Fully automatic prober
Chuck, 12"
With temperature controller: Room°C-150°C
Single loader
(25) Cassettes
Auto wafer ID reader: ESI Bullet
Auto needle alignment / Auto wafer alignment
Auto card change
Needle cleaning pad: 150 mm x 150 mm
GP-IB Interface
Ethernet
Touch sensor for clean pad
Power supply: 200 VAC, 1 Phase
Missing parts:
Operating system: Windows 2000
FA0406 APC Control board
E1 CCD Camera
Temperature controller
ON/OFF Switch control board
Power supply module
2007 vintage.
TSK UF3000+MHF4000 prober is an versatile, fully-automated prober equipment offering the highest possible testing accuracy and throughput. This prober is capable of measuring, testing, and analyzing a wide variety of devices and components on a board. It features a high-precision linear gantry system, a comprehensive inspection library, and a powerful control unit. The UF3000+MHF4000 prober features a high-precision, linear gantry machine that moves with micrometer resolution and an adaptive feedback control tool that adjusts to device variations. This allows the prober to accurately and repeatably scan and analyze targeted device and component characteristics. The comprehensive inspection library enables this prober to read a wide variety of test parameters, including granularity, resistance, voltage, pin-to-pin times, and more. The UF3000+MHF4000 prober is also equipped with an intuitive control asset integrated with ACCRETECH Auto Probing Library (APL). This allows operators to quickly set up the prober and make adjustments to test parameters. They can also automatically align the probe tips to the device's surface, while the model's auto calibration capability eliminates any need for recalibration. Furthermore, the prober's replaceable 100/1368 pin arrays make it easy to use the tool with a wide range of devices and components. The UF3000+MHF4000 prober is an ideal tool for testing, inspecting, and analyzing a wide variety of devices and components on a board. With its versatile features, high-precision linear gantry equipment, and comprehensive inspection library, the prober can accurately locate and analyze targeted device and component characteristics in a fraction of the time of traditional testing methods. This makes it an invaluable tool for engineers and scientists in the electronics and semiconductor industries.
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