Used ACCRETECH / TSK UF 3000 Omega #9253251 for sale

ACCRETECH / TSK UF 3000 Omega
ID: 9253251
Vintage: 2005
Prober Manipulator: MHF4000 Loader: Front1 right No fail mark inspection Needle inspection Auto needle alignment Auto needle height setting No off site marking Auto card changer: APC Camera oblique + Coaxial TH Clamp No high rigidity chuck No RS232 GP-IB No driver marker Cleaning unit: Pedestal: Normal Hot / Cold chuck temperature: 50° to 150° No internal printer No external printer OCR APC SACC Cart No linear scale No TTL No RF-TAG No tilting 2005 vintage.
ACCRETECH / TSK UF 3000 Omega is a table-top type prober designed for failure analysis, integrated circuit testing, and wafer probing. TSK UF 3000 Omega features a standard step height of 200μm, enabling a chip size of up to 60 mm. It is equipped with two thermoelectric coolers, four stepper motors, and an independent control unit that allows for easy operation of the device. The main function of ACCRETECH UF 3000 Omega is to support fine-pitch probing of integrated circuits on printed circuit boards as well as in-circuit testing and probing of wafers. It is equipped with several probe arms and the unique alphanumeric commands found on the control panel make it easy to switch between operations. Non-contact probes can also be used for probing, ensuring that a device's delicate components are not damaged during testing procedures. The prober's height, pressure, temperature, and bias control features allow for various probing activities. UF 3000 Omega is designed for ease of use and includes a wide range of features and functions. It has a touch-screen display for setting up probing programs, and dedicated keys to control each stage of testing. It also supports automated probing operations and customization of probing plans for executing precise tests. In addition, ACCRETECH / TSK UF 3000 Omega offers an optional parallel loading module (PLM) that allows the simultaneous loading of up to twenty four etched parts. The PLM helps to reduce loading and unloading time, and is especially useful for processing and testing of high-production wafer volumes. TSK UF 3000 Omega prober is capable of probing at high speeds with its 200 μm step height and is considered an ideal system for supporting critical failure analysis and fault localization.
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