Used ACCRETECH / TSK UF 3000 Omega #9253251 for sale
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ID: 9253251
Vintage: 2005
Prober
Manipulator: MHF4000
Loader: Front1 right
No fail mark inspection
Needle inspection
Auto needle alignment
Auto needle height setting
No off site marking
Auto card changer: APC
Camera oblique + Coaxial
TH Clamp
No high rigidity chuck
No RS232
GP-IB
No driver marker
Cleaning unit:
Pedestal: Normal
Hot / Cold chuck temperature: 50° to 150°
No internal printer
No external printer
OCR
APC SACC Cart
No linear scale
No TTL
No RF-TAG
No tilting
2005 vintage.
ACCRETECH / TSK UF 3000 Omega is a table-top type prober designed for failure analysis, integrated circuit testing, and wafer probing. TSK UF 3000 Omega features a standard step height of 200μm, enabling a chip size of up to 60 mm. It is equipped with two thermoelectric coolers, four stepper motors, and an independent control unit that allows for easy operation of the device. The main function of ACCRETECH UF 3000 Omega is to support fine-pitch probing of integrated circuits on printed circuit boards as well as in-circuit testing and probing of wafers. It is equipped with several probe arms and the unique alphanumeric commands found on the control panel make it easy to switch between operations. Non-contact probes can also be used for probing, ensuring that a device's delicate components are not damaged during testing procedures. The prober's height, pressure, temperature, and bias control features allow for various probing activities. UF 3000 Omega is designed for ease of use and includes a wide range of features and functions. It has a touch-screen display for setting up probing programs, and dedicated keys to control each stage of testing. It also supports automated probing operations and customization of probing plans for executing precise tests. In addition, ACCRETECH / TSK UF 3000 Omega offers an optional parallel loading module (PLM) that allows the simultaneous loading of up to twenty four etched parts. The PLM helps to reduce loading and unloading time, and is especially useful for processing and testing of high-production wafer volumes. TSK UF 3000 Omega prober is capable of probing at high speeds with its 200 μm step height and is considered an ideal system for supporting critical failure analysis and fault localization.
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