Used ACCRETECH / TSK UF 3000 #293617413 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 293617413
Prober.
ACCRETECH / TSK UF 3000 is a compact, advanced probe station designed for high throughput failure analysis, device engineering, and failure analysis. This prober features a modular design that allows for customizing the system based on application requirements. The platform is highly accurate and provides superior image resolution. This prober has three wafer stages that come with a thermal chuck, which can be configured for temperatures of up to 150 degrees Celsius. The stages are manually and stepper motor operated for automated alignment and positioning of the wafer on the chuck. There is also a 4-axis joystick that allows for manipulation of the wafer during testing. The intuitive user interface is designed to enable easy programing and operation of the prober. The prober is equipped with probes, temperature probes, and alignment cameras, designed to ensure accuracy, repeatability, and reliability during testing. The probes are designed to provide superior contact, accuracy, and repeatability. The probe holder is designed to reduce contact contamination and improve wire bonding. This system also has a precision XY stage with a joystick control, which allows for precise and reliable probing even on the smallest of components. TSK UF 3000 prober also includes a computer-controlled temperature controller and thermoelectric conditioning system, for precisely controlling the temperature during the testing process. This prober is a powerful tool, with a high-end version that offers four active probes, real-time video signal observation, faster scanning speed, and longer life. ACCRETECH UF3000 prober is a reliable and versatile instrument that is suitable for both research and quality control purposes. The prober is easy to use and is capable of conducting multiple testing operations in a single session. The prober is also optimized for small-sized components, offering superior accuracy and repeatability, making it an ideal choice for failure analysis, device engineering, and failure proofing.
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