Used ACCRETECH / TSK UF 3000 #293621711 for sale

ACCRETECH / TSK UF 3000 is a Semiconductor Prober used for performing electrical testing on prototype devices. It is designed to be used in small to medium-sized research and development laboratories. The prober has a flexible, modular design with interchangeable components for different types of device testing. The prober consists of a modular base unit with a platform for accommodating up to eight probe cards. It has integrated chambers for wafer alignment, test specimen clamping, and cooling. It is capable of measuring electrical characteristics over a wide temperature range (-20 to 200°C). The prober also has probes that conform to various test structures such as ICs and MEMs, allowing for customizable test configurations. The prober also provides a variety of control functions including auto-level control, auto-adjustment of probe force, and auto-targeting of testing speeds. It also offers a variety of data acquisition channels including analog voltage and current, digital voltage, and digital signals. Additionally, the prober offers the ability to record and replay test results, allowing users to fine-tune their testing. TSK UF 3000 is equipped with a graphical user interface (GUI) for easy device setup. The GUI allows for programming test sequences, editing specimen parameters, and collecting/displaying data. Additionally, the prober supports LabVIEW and ASCOT for additional programming flexibility. Other features of ACCRETECH UF3000 include on-board libraries for setting up tests, automatic background correction and compensation, improved valve check accuracy, dynamic impedance control, and advanced test pattern functions. The prober also allows for remote monitoring and control via Ethernet connection, and automatic result transmission to a Network Data Management System. Overall, UF 3000 offers a wide range of testing capabilities, allowing users to efficiently and accurately acquire and analyze device performance data. With its modular design and different types of probes, the prober can be easily configured to meet specific device testing requirements. Moreover, the advanced feature-set ensures that the device's performance remains reliable over time, enabling users to conduct their testing with confidence.