Used ACCRETECH / TSK UF 3000 #293621714 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 293621714
Wafer Size: 12"
Vintage: 2006
Wafer prober, 12" Process: V5400 Hot air Load port ATT A300T Air cooled chuck X,Y Overall accuracy: ±2.0 µm (Temperature stability: ±1°C) X,Y Stage accuracy: ±1.0 µm Z Axis stroke (Applicable stroke): 37 mm Z Axis control accuracy: ±2 µm Stage durability: 200 kgf Does not include Hard Disk Drive (HDD) Power supply: 120 AC, Single phase 2006 vintage.
ACCRETECH / TSK UF 3000 is a prober specifically designed for today's production environment. It features a compact and lightweight design with multi-dimensional force control that helps to fulfill high accuracy probing needs. TSK UF 3000 supports both 2-D or 3-D probe scanning and allows users to precisely control the size, angle and force applied to each step of the probing process. The probe station provides a range of measurement and inspection options such as pattern recognition, stain detection, part identification and surface image analysis. ACCRETECH UF3000 uses a 3 axis motorized stage to provide accurate positioning and fast sample switching, allowing users to quickly adjust trace pitch and move in two directions (X and Y axis) with a controlled Z axis rise. The high speed data acquisition and flexible program design also enable multiple program commands for more complex probing and testing processes. The system is equipped with an automated calibration system that ensures high-precision and accurate measurement performance. It is capable of measuring different contact angles from straight to rounded and a wide variety of coils, pins and rope contacts. The user friendly interface and real time acquisition mode make it easy for the user to monitor various stages of the probing process. Additionally, a variety of external plug-ins such as hi-speed, audio and video can be connected directly to TSK UF3000. UF3000 offers an enhanced probing capability, accuracy and speed while reducing operator fatigue and improving process control. The robust and reliable design ensures reliable performance throughout the probing process and heightened defect analysis accuracy. Furthermore, it is compatible with different types of probes, allowing users to optimize their data acquisition process depending on the desired results. With its ergonomic design, quick response time and safe operation, ACCRETECH UF 3000 is an essential tool for any modern semiconductor assembly or testing environment.
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