Used ACCRETECH / TSK UF 3000 #293621715 for sale
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ID: 293621715
Wafer Size: 12"
Vintage: 2006
Wafer prober, 12"
Process: V5400 Hot air
Load port
ATT A300T Air cooled chuck
X,Y Overall accuracy: ±2.0 µm (Temperature stability: ±1°C)
X,Y Stage accuracy: ±1.0 µm
Z Axis stroke (Applicable stroke): 37 mm
Z Axis control accuracy: ±2 µm
Stage durability: 200 kgf
Does not include Hard Disk Drive (HDD)
Power supply: 120 AC, Single phase
2006 vintage.
ACCRETECH / TSK UF 3000 is a full-featured prober specifically designed to make probing contact testing efficient, accurate and easy. It is an advanced equipment that provides ultrafast probing and testing with high stability and accuracy. The system operates with precision movements, allowing users to precisely control the probing force, speed and accuracy. TSK UF 3000 is equipped with a multi-axis stage and a rigid frame structure, enabling accurate and repeatable probing of small, DFT fined test sites. The stage is capable of travels up to 400mm in each axis, with speeds of up to 300mm/s. The unit also features a state-of-the-art control machine that provides real-time data feedback and reporting. The prober can be used for probing from 0.3 mm to 8.0 mm pitch. ACCRETECH UF3000 supports a wide range of probing tool applications; from simple sheet-metal probing to complex IC probing on a variety of substrates. The prober is also capable of simultaneous integrated probing, testing and evaluation activities, making it ideal for an array of applications, such as DFT resolved device evaluation, substrate probing, and loop/distance measurement. In addition, the prober features open-architecture software to support advanced probing and testing applications. Xmprobe software allows users to customize the tool for their applications and deliver results quickly. Moreover, the prober is highly reliable and repeatable, delivering stable operating performance and consistent output. The asset is fully compatible with TSK XProbe series of probes, giving users a broad range of probing accuracy, stability and fine movements for precise probing of small test points and delicate detection signals. These probes provide enhanced performance, handling larger capacitance test sites accurately with low force contact. UF 3000 is the perfect solution to handle a variety of probing applications. Its full-function capabilities and precise operation assure productivity and reliable results.
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