Used ACCRETECH / TSK UF 3000 #293621723 for sale
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ID: 293621723
Wafer Size: 12"
Vintage: 2006
Wafer prober, 12"
Process: V5400 Hot air
Load port
ATT A300T Air cooled chuck
X,Y Overall accuracy: ±2.0 µm (Temperature stability: ±1°C)
X,Y Stage accuracy: ±1.0 µm
Z Axis stroke (Applicable stroke): 37 mm
Z Axis control accuracy: ±2 µm
Stage durability: 200 kgf
Does not include Hard Disk Drive (HDD)
Power supply: 120 AC, Single phase
2006 vintage.
ACCRETECH / TSK UF 3000 is a fully automated prober which is tailored to perform manual testing of individual unpackaged devices as well as packages and ICs. This prober features a modular design that allows for flexible handling of a wide variety of IC tests. The prober's single platform design supports the capability of multiple probing cards and varying pin counts. The probing station is constructed using a continuous x-y automated stage with a 16bit linear encoder. This stage serves to precisely position the test structures and probe cards. The modular design and easy transition between individual unpackaged devices, packages, and ICs makes the prober efficient for varied test scenarios. TSK UF 3000 is equipped with a Z probing system that allows for the ID of pin location and provides a measure of the force being applied to the test structures. The super-independent, patent-pending touch-scope technology ensures that the detection of fine pitch test pins is reliable and accurate. This technology also aids in making ACCRETECH UF3000 capable of high throughput and quick cycle times. UF3000 also features a 250 kHz bandwidth, high precision AC carrier signal to reduce noise and speed up the performance. It comes equipped with a strong EMF noise cancellation system and built-in noise rejection capabilities that reduce the test time while increasing the sensitivity of the test structure signals. In addition, the advanced software allows for ACCRETECH / TSK UF3000 to be versatile and easily configurable to different test scenarios. The software library also contains a display monitor which graphically presents test results in real-time, statistical analysis of the data, and a vast array of settings that allow for the scaling of individual test parameters. Overall, ACCRETECH UF 3000 is an automated prober that ensures accurate testing of devices and ICs. Its modular design and advanced software make it a suitable choice for any type of testing scenario. Its high data throughput, fast cycle times, reliable noise cancellation, and adjustable test parameters make TSK UF3000 an invaluable tool for quality assurance.
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