Used ACCRETECH / TSK UF 3000 #293621724 for sale

ACCRETECH / TSK UF 3000 is a three-axis prober designed for comprehensive wafer testing. This prober features a 300 mm stage with a high-resolution linear scale, and a large wafer capacity of up to 8". The system is designed to handle wafer backside, edge, and notch testing, as well as complete electrical and physical properties testing. TSK UF 3000's 300 mm stage is capable of precise, high-speed scanning from 1µm to 200mm/s. It can also precisely measure microscope field expansion for wafer backside testing. The system is able to accurately image wafer backside, edge, and notch testing with superior feature recognition, overexposure prevention, and high resolution pattern recognition. The prober features multiple wafer mounting solutions, such as waffle pack and DOB carriers, both designed to ensure that the thermal environment in the prober is consistent and stable. Additionally, the prober is equipped with two sample changing systems. The first is a cassette sample changer, which allows for automated sample loading and unloading from the cassette. The second is a vacuum-based, self-lifting sample holder, which allows for faster wafer exchange and greater stability during testing. ACCRETECH UF3000 is able to process many types of device and wafer types, and can handle a range of wafer sizes from 3" to 8". It also has an adjustable manipulation range and step, allowing for users to customize their testing process and setup. Additionally, the system is compatible with a variety of test equipment, giving users access to a wide range of applications. Overall, ACCRETECH UF 3000 is an advanced, three-axis prober designed to handle various testing requirements and device types. Its features include precise scanning, wafer mounting solutions, automated sample exchanging, and compatibility with multiple test equipments. It is designed for accuracy and stability, making it an ideal solution for testing most types of devices.