Used ACCRETECH / TSK UF 3000 #293621730 for sale

ACCRETECH / TSK UF 3000
Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 293621730
Vintage: 2006
Prober Cold chuck Chiller SCU-600 2006 vintage.
ACCRETECH / TSK UF 3000 is a high-performance prober designed for the efficient testing of semiconductor devices. It features a high-speed, automated prober arm with a compact footprint and is capable of handling a wide variety of devices. TSK UF 3000 has a unique 3-axis motion system which enables it to move quickly and accurately in the X, Y, and Z direction. This ensures that sample probing operations can be done accurately and with minimal set-up time. It also features a user-friendly full-featured control interface which provides a range of options for controlling the prober and setting up automated sample probing routines. ACCRETECH UF3000 prober has a maximum movement speed of 400mm/sec, ensuring fast and accurate sample collection. It has a maximum chuck table size of 8" diameter and can handle wafers up to maximum of 6". The temperature of the sample is also easily maintained and controlled, ranging from room temperature up to +400˚C. UF 3000 is designed to provide high accuracy and repeatability. It has a repeatability of ±0.001mm, which ensures that measurements taken during a single session can be fully trusted. The accuracy of the prober is also top-notch, with a positioning accuracy of 0.05µm. UF3000 also features optical calibration, which precisely adjusts the position of the prober head for accurate probing of devices. In addition, TSK UF3000 prober has a wide range of options, including CISM and SEVG options to minimize contamination, an automated probe tester to ensure proper contact between the device and the probe, and an automated centering system to ensure uniformity in sample measurements. ACCRETECH / TSK UF3000 also includes an open software architecture which allows for custom programming and control. Overall, ACCRETECH UF 3000 is a highly versatile prober which can be used for accurate, reliable, and repeatable semiconductor device testing. Its compact, high-speed design makes it ideal for any testing environment, while its advanced features ensure accurate and reliable probing.
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