Used ACCRETECH / TSK UF 3000 #293632720 for sale

ACCRETECH / TSK UF 3000 is an advanced probe station that is used to test a variety of electronic devices. It features an integrated environmental control chamber and is equipped with an electronic probe card, which is used to measure current and voltage across a variety of factors. This equipment is specifically designed to ensure accurate and repeatable electrical characterizations of semiconductor devices and produce high-resolution topographic images. The system is comprised of a base unit, which houses the integrated environmental chamber. The unit is designed to create a temperature-controlled environment within the chamber, allowing for accurate testing conditions for connected devices. The unit is equipped with an advanced quench detector, which monitors the thermal activity of the device in order to protect it from debris and acid vapor deposition. The built-in computer-controlled microprocessor enables users to access unit parameters and experiment data easily. TSK UF 3000 includes an electronic probe card, which enables the testing of current and voltage across a range of measurements, including current signatures and IV characteristics. The card incorporates a high-performance X-Y stage scanning machine, which can be used to map the topography of a device. Additionally, the tool is capable of detecting defects in the device and can characterize the electrical properties of nanometer-scale structures. ACCRETECH UF3000 asset is designed with a wide variety of safety features, including a grounding model, equipment interlocks, and position limiting controls. It also has an automatic fire extinguisher and emergency stop switch, ensuring the highest level of safety. Additionally, the system is compatible with a variety of software applications, allowing users to access and manage unit parameters, data logging and experiment data easily. Overall, ACCRETECH / TSK UF3000 probe station is a highly reliable, advanced tool for semiconductor testing and characterization. It provides an integrated environmental chamber and is equipped with an electronic probe card, enabling the testing of current and voltage across a range of measurements. Utilizing a high-performance scanning machine, UF3000 is capable of detecting and characterizing nanometer-scale devices, while keeping users safe with a variety of safety features.