Used ACCRETECH / TSK UF 3000 #9160192 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9160192
Vintage: 2010
Auto wafer prober 2010 vintage.
ACCRETECH / TSK UF 3000 is a prober designed to provide accurate, repeatable measurements of semiconductor device parameters. It has a variety of features that make it ideal for use in the production environment. The primary feature of the prober is a high accuracy surface measurer, which provides accurate measurements of feature sizes and other characteristics of semiconductor device surfaces. TSK UF 3000 prober has an automated sample handling equipment, as well as integrated vision and control systems. The prober is also equipped with a variety of probes, including mechanical probes, optical probes, and microwire probes. ACCRETECH UF3000 prober features a high accuracy contact head, capable of measuring feature sizes from as small as 0.1 micron. This allows for precise and repeatable measurements of feature sizes and other device characteristics. The contact head utilizes a variety of different probes, which are optimized for the substrate material and the type of device being measured. UF 3000 prober also has an automated sample handling system that allows for full automation of sample loading and measuring operations. This unit allows for the loading of multiple samples, as well as features an automated comparison of the results from each sample. This automated machine helps to reduce the time and effort spent processing and testing samples, as well as helping to ensure the accuracy of the results. UF3000 prober features an integrated vision and control tool, as well as various signal processing techniques. These features help to accurately read and analyze the signals that the probes generate, enabling highly precise results. It also has a variety of software tools and software applications that help to refine the results obtained from the prober and visualize the data. Overall, ACCRETECH UF 3000 is a highly advanced prober and offers a variety of features for accurate measurements of semiconductor devices. Its integrated vision and control systems, automated sample handling systems, and wide range of probes make it ideal for use in the production environment. The prober is easy to use, and is capable of providing highly accurate and repeatable results.
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