Used ACCRETECH / TSK UF 3000 #9182809 for sale
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ID: 9182809
Wafer Size: 12"
Vintage: 2004
Full auto wafer probers, 12"
2004 vintage,
ACCRETECH / TSK UF 3000 is an advanced metrology prober designed for wafer and bare die probing and testing. It features a high throughput multi-axis motion table for high speed probing. TSK UF 3000 features up to four independent probes or test heads, with a maximum probing speed of 2000 components per hour. It also has a specially designed vacuum chuck that is adjustable to support wafers of various sizes. ACCRETECH UF3000 has a highly efficient two axis motion table, that can precisely position the probe or test head at any coordinate with maximum speed. It also has a highly reliable electrical control equipment that enables fast and smooth motion control. It has an advanced auto zooming capability that allows for fast wafer alignment and accurate probe positioning. Moreover, it also has an automated system for alignment of probes. UF 3000 also includes an embedded probing software which allows for efficient probe selection. Additionally, it has a number of software features that enable the user to control and analysis the probing results, and also to adjust the test settings. Furthermore, it has a built-in unit for visualizing, sharing and archiving probing data. Additionally, it also includes an error detection machine that allows the operator to view problem areas and identify the cause of the issue. ACCRETECH / TSK UF3000 also includes a range of accessories and tools for convenient and precise probing. The accessories include a variety of probes and test heads, as well as an anti-electrostatic device and a variety of instrument boards. In addition, it includes a number of additional software tools for probing and testing. Overall, ACCRETECH UF 3000 is an advanced prober designed for fast and precise wafer probing and testing. It has a range of high-end features, such as an auto-zooming capability, an embedded probing software, error detection tool, and a range of accessory tools. All of these features make it ideal for a wide variety of probing and testing applications.
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