Used ACCRETECH / TSK UF 3000 #9192665 for sale

ACCRETECH / TSK UF 3000 is a prober designed for semiconductor front-end manufacturing test and analysis. It is a high-performance, non-destructive, automated prober that offers critical features for a wide range of testing and inspection needs. TSK UF 3000 features a high-speed stage and advanced circuitry for accurate wafer probing. It is capable of handling up to 8 wafers at once, providing high throughput and flexibility. The prober is designed to be modular and can be configured for specific applications. ACCRETECH UF3000 offers two types of automated and interchangeable measurement blocks, which are independent of each other. This enables the prober to measure a variety of test products, such as panel products, wafer edges, and probe cards, or to perform device characterization. The unique design of UF3000 prober allows users to adjust the position of the wafer chuck without changing the test block. In addition, the prober has four precision motorized stages organized in an X, Y, θ, and Z axis configuration to provide high accuracy and efficiency. Advanced software and data acquisition capabilities are included with ACCRETECH UF 3000 prober. The software includes an integrated test-profile editor, which is designed to simplify the test set up with true graphical- user-interface capabilities. Built-in data acquisition systems provide real-time analysis of test data, allowing for quick analysis of test results. The prober also features a built-in system for wafer placement ( alignment ) calibration and handling. UF 3000 prober is designed with safety in mind and comes with onboard safety features such as interlock switch, wafer counting sensor, and lift sensor. The prober also includes redundant vacuum sensors, as well as an independent pulse generator to ensure reliable wafer handling. The construction of the prober is also designed to support demanding production environments with its stainless steel design and robust construction. Overall, TSK UF3000 prober is a powerful and versatile prober that is suitable for a wide range of applications in semiconductor front-end manufacturing test and analysis. Its advanced features and modular design make it ideal for achieving efficient and reliable device testing.