Used ACCRETECH / TSK UF 3000 #9193440 for sale

ACCRETECH / TSK UF 3000 is a combination of automated observation probe station and a 3D microscope that provides accurate measurements for integrated circuit (IC) dies, flip chips, MEMS, wafers and packages. TSK UF 3000 is designed to be a perfect choice for a wide range of applications in the semi-conductor industry, such as failure analysis, quality control and process optimization. ACCRETECH UF3000 is equipped with a 150mm inverted Maxtop Microscope with a 3D perfect alignment feature, providing stability and accuracy when used with various probes. It also offers a wide range of probes, such as conductive probes, thermocouple probes, passive probes and E-beam probes. It also comes with a high-speed scanning feature, allowing for detailed analysis of the IC die and surface features. ACCRETECH / TSK UF3000 is equipped with the world's fastest XYZ stage - 200 um/second, which helps to quickly and accurately measure IC die and substrate characteristics. It offers a resolution of 0.5um with a non-contact depth accuracy of 3µm. Additionally, the fully automated feature of TSK UF3000 helps users to increase throughput rate without the need for manual operation. The system also provides temperature control of the sample, helping to reduce resistor variations and to perform more precise measuring. Through its Ethernet connections, integrated signal conditioning is possible, allowing for accurate probing signals. It's equipped with a cooling module, which ensures a stable environment for the sample die. UF 3000 is a reliable, high-performance prober for IC die probing and analysis. The advanced features and easy operation make it an ideal choice for a variety of applications. With its fast XYZ stage, high resolution, temperature control and Ethernet connections, ACCRETECH UF 3000 can provide accurate measurements and analysis with minimal downtime.