Used ACCRETECH / TSK UF 3000 #9195736 for sale
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ID: 9195736
Probers
Needle inspection option
Auto needle alignment option
Auto needle height setting
Off site marking: No
Auto card changer: Card PGV / APC
Camera oblique + coaxial
TH Clamp
Card guide drawer: No
High rigidity chuck
RS232: No
GP-IB
Driver marker: No
Cleaning unit: Normal plate
Hot / cold chuck temperature: 50 - 150°
Internal printer: No
External printer: No
Single cassette
Dual cassette: No
SACC CART
Linear scale
TTL: No
RF-TAG: No
Tilting: No.
ACCRETECH / TSK UF 3000 is a prober used in wafer probing applications. It is a state-of-the-art equipment designed specifically for dynamic and static electrical testing of semiconductor and optoelectronic integrated circuits. It is capable of testing a wide variety of device types, such as CMOS, BiMOS, and bipolar transistors, as well as memory devices and logic ICs. The system consists of a main frame, a prober, and a series of test heads. The main frame is a vertically-oriented setup which comprises of a prober base, a motorized platform, and a series of sensors for controlling the unit's motion. The prober is the component which houses the probes and which performs contact and voltage-measurement operations. The test heads are expandable modules which allow the user to configure the machine for a particular device configuration. The tool is equipped with modular measuring heads and a large variety of probes enabling the user to customize the asset to specific test requirements. TSK UF 3000 offers excellent resolution and speed. Its strobe accuracy is unsurpassed with an accuracy of 1 microsecond and a repeatability of +/- 0.3 microsecond. Additionally, the model has a maximum probing speed of up to 50 kHz offering flexibility and speed while maintaining superior probing accuracy. In terms of safety and environmental protection, this prober is designed with safety in mind. It has built-in safety features such as a Low Pressure Safety Equipment and Zone Protection features, to ensure that the system is used as safely as possible. Additionally, its modular design helps to reduce vibration, thus improving reliability and reducing energy consumption. ACCRETECH UF3000 is an ideal solution for wafer probing. It offers high-speed resolution, superior accuracy and safety features, while its modular design allows for an efficient customization of its measurement heads. The unit's scalability ensures that it can easily be adapted for future device testing as technologies advance.
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