Used ACCRETECH / TSK UF 3000 #9196328 for sale

ACCRETECH / TSK UF 3000 is a prober developed by TSK/TOK that is capable of handling wafer and device testing. This product combines a high-speed probing equipment with high-resolution optical techniques to produce precision measurements. TSK UF 3000 also utilizes a wide array of tool tips to support a variety of test requirements. This system is designed to enable fast automated probing with high throughput while maintaining a high level of accuracy. The features of ACCRETECH UF3000 prober include high-speed probe cards with 200kz sampling rate, high-precision XY positioning capability, and a high-resolution optical microscope that provides 0.5μm imaging resolution. The prober also includes a variety of probe cards which can be configured to enable deep probing for 3D device testing. Additionally, the unit is outfitted with an Environmental Control Unit which allows for temperature and humidity control capabilities. This ensures accuracy and repeatability for ongoing testing. ACCRETECH UF 3000 prober provides powerful analytic tools to enable fast and efficient characterization of semiconductor devices. These tools include an Analysis Center suite of software, which provides an integrated environment for analysis of device characteristics such as IV, C-V, ESD protection, and timing measurements. The Analysis Center features a "find-and-fix" capability to quickly evaluate data and pinpoint problems. Additionally, the prober comes with an intuitive graphical user interface that provides users with immediate access to all the data and ability to quickly manipulate it. UF3000 prober also provides Spectral Analysis capabilities that enable efficient measurement of signal integrity such as jitter, crosstalk, and other aspects of signal performance. The machine utilizes a multi-tier protection machine to safeguard data integrity and provide safe retention of test results. Overall, UF 3000 prober is an advanced and efficient solution for automated testing. The tool provides powerful tools for quick and accurate testing and characterization of semiconductor devices. The asset is designed to accommodate high-volume production requirements while maintaining accuracy. Its wide array of features and intuitive graphical user interface provide easy access to all data and make it an ideal solution for comprehensive testing.