Used ACCRETECH / TSK UF 3000 #9199739 for sale

ACCRETECH / TSK UF 3000 is a prober designed for inspecting wafers and other substrates. This prober is a high-precision and automated equipment that is designed to provide reliable measurements while ensuring consistent performance. TSK UF 3000 prober is equipped with an advanced automatic sample corrector (ASC) system to detect and correct height variations in the samples, allowing the operator to obtain unprecedented measurement accuracy and repeatability. The unit also features a multi-drive probe head with a wide range of selectable probe heights to maximize flexibility in probe-to-surface contact. In addition, ACCRETECH UF3000 features an intuitive user interface that allows for easy operation and data analysis. With a wide range of configure-able parameters, users can customize the machine to their specific applications by setting thresholds, sample types and measurement types, for each specific test. The prober is designed with a CCD (Charge-Coupled Device) camera to provide capture of two-dimensional images of specimen. The CCD cameras can monitor test specimens for overhead view as well as down view. Moreover, ACCRETECH UF 3000 supports the latest double-sided wafer testing capabilities. The prober also provides an automatic inspection tool that facilitates automatic inspection and auto-alignment of probe needles. In order to maximize the accuracy and repeatability of the measurement results, UF 3000 prober is designed with a closed-loop feedback control tool. The asset is designed to track the motion of the contact needles, providing real-time corrections to ensure the contact patch remains in the same spot each time. In conclusion, UF3000 prober is a high-precision automated model that ensures precise measurements while keeping repeatability. It features an easy to use user interface that allows users to customize the equipment to their specific applications. The prober also features a closed-loop feedback system that maximizes accuracy and repeatability and a multi-drive probe head with a wide range of selectable heights for greater flexibility. The overall result is an automated unit that is easy to use and provides reliable and precise measurements and analysis.