Used ACCRETECH / TSK UF 3000 #9206780 for sale

ACCRETECH / TSK UF 3000 is a high-precision, low-contact, high-speed prober designed for use in semiconductor and other circuit performance testing. It combines precise movement, low-contact probes and high-speed, acquisition and signal analysis capabilities to provide a comprehensive solution for circuit performance testing. TSK UF 3000 offers a number of features tailored for semiconductor testing applications. Its specially-designed scanning head can be moved quickly and accurately in the X, Y, and Z directions at up to 12,000 cycles per second. This provides a fast and accurate method of testing large circuits without the need to physically probing every single chip. In addition, the scanning head features a low-contact force that minimizes cross-talk and damage to fragile structures. ACCRETECH UF3000 also features built-in signal analysis capabilities that allow the probe to analyze signals on a feature-by feature basis. This eliminates the need to manually record and analyze signal data. The analysis results can then be used to automatically adjust the prober's movements for improved testing accuracy. ACCRETECH UF 3000 is also capable of working with a variety of different probe types, from single-contact probes to matrix probes with up to 8 electrodes. This provides flexibility for customers who have different needs for their semiconductor testing. Overall, ACCRETECH / TSK UF3000 is an advanced prober designed for high-performance testing of semiconductor circuits. It features high-speed movement, low-contact probes and an integrated signal analysis capabilities that make it a powerful and comprehensive tool for any semiconductor testing application.