Used ACCRETECH / TSK UF 3000 #9237584 for sale
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ID: 9237584
Wafer Size: 8"-12"
Vintage: 2007
Prober, 8"-12"
Used for T 5581 Tester
Right loader
Chuck type: ARTS-LC12
Does not include OCR
Cleaning pad
Temperature range: -40°C to 150°C
2007 vintage.
ACCRETECH / TSK UF 3000 is a highly advanced prober specifically designed for the production environment and used to inspect small or high-density components. It is a fully automated system capable of quickly collecting high fidelity electrical measurements. The prober's power solution is optimized for speed and accuracy, providing fine measurements and minimising raw data processing time. Its modular architecture allows for the integration of process modules for accurate and repeatable results for multiple types of devices and manufacturers. The prober utilizes a compact vertical stage layout, minimizing total footprint size required for setup. Combined with the prober's modular design, it is able to adapt quickly to different production lines and operation scenarios. All measurements are managed using the powerful Environmental Views software that includes multiple probes and mappers. The mappers use either pad or socket contact points, depending on the requirements of the component. The contact points on TSK UF 3000 can be selected, changed, and calibrated in-place while accelerating the debug time cycle. Probe cards are quickly removed and replaced for different test scenarios, ensuring accurate and repeatable data. ACCRETECH UF3000 consistently delivers the highest detection sensitivity and signal-to-noise ratio for electrical tests. Its extremely low measurement noise leads to less variation in results and better accuracy. The prober also provides non-contact inspection capability for surface mount components, using laser or camera-based systems to provide automated inspection. ACCRETECH UF 3000 is an advanced prober that offers a comprehensive solution to any production test and measurement requirement. It is a powerful system with a range of features, such as fast mapper measuring times, low noise levels, laser inspections and multiple probe points for better accuracy. The modular design allows the prober to fit into a wide variety of production environments, offering repeatable and reliable measurements.
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