Used ACCRETECH / TSK UF 3000 #9245665 for sale

ACCRETECH / TSK UF 3000 is a prober typically used in semiconductor wafer testing and evaluation. It is a versatile solution for high throughput measuring and testing of various semiconductor wafer types. It is able to handle a wide range of wafer sizes, including both large and small-sized wafers. TSK UF 3000 has an innovative design which allows it to be used simultaneously for multiple wafers in parallel. The prober's settings can be easily configured according to the type of wafer being tested. There are multiple parameters that can be adjusted to accommodate different types of wafer sizes and thicknesses. ACCRETECH UF3000 has a range of features that can be used for testing different wafer materials, such as metal films, nitrides, gate oxide, and silicon. It also features a built-in visual inspection system that allows users toquickly identify defects on the wafer. The prober's measuring head is equipped with a 6-axis motion control system that allows precise wafer placement and movement. The measuring head can be tilted up to 45° and rotated to measure corner alignment and circularity. The prober also features a wafer inspection mechanism to detect open vias and other contaminants. Furthermore, a wireless image transmission system allows users to send images to a connected computer for measuring, plotting, and analysis. UF 3000 has a high-resolution LCD display and intuitive graphical user interface (GUI). The LCD display can be used to display test results and various features, such as data plotting and wafer surface inspection. The graphical user interface makes operation easy and convenient by providing simple access to the necessary features and options. ACCRETECH UF 3000 is a reliable and precise prober that can be used in various applications, including wafer sorting, process development, product development, and quality control. It is an ideal choice for production lines due to its high-performance and ability to reduce the cost of wafer yield.