Used ACCRETECH / TSK UF 3000 #9254154 for sale

ACCRETECH / TSK UF 3000 is a prober designed for highly accurate metrology and process control in high-performance semiconductor manufacturing. It is capable of automating the probe process and providing accurate and reliable measurements. TSK UF 3000 utilizes a vertical scanning probe that creates images of semiconductor chips. Using individual contact probes to test multiple pins in a single sweep, ACCRETECH UF3000 can rapidly reach and maintain a steady state of accuracy. ACCRETECH UF 3000 features a range of advanced optical and mechanical subsystems. The 4-pin scanning module is designed to maximize accuracy in testing patterns. It features an adjustable optical system which focuses on the selected test pad with a beam width of approximately 1.5μm. The optics are able to read both longitudinal and height data, providing an accurate representation of the chip. The device also utilizes an automated sample holder that adjusts for different chip size and lateral range of sample. ACCRETECH / TSK UF3000 is capable of creating a high degree of accuracy and repeatability during the probing process. Its repeatability of 0.50 μm allows for maximum process control and repeatable results. It also features a multi-pass scanning capability and four times magnification that allows for greater speed and accuracy of operations. TSK UF3000 includes automated software for test process control, as well as an integrated statistical excellence module. This assists with optimization of the probing process while providing real-time process control. UF3000 also includes an automated calibration system and intelligent probing strategy software, which enables faster, more accurate results with fewer passes. UF 3000 is highly adaptable and can be used for a variety of applications and chip configurations. Its intuitive design makes it easy to set up and operate. In addition, it features a self-adjusting probe head, which ensures the sample is always in full contact with the probe. The prober is designed to maximize productivity and reduce cost by providing a robust solution to the high-performance semiconductor inspection process.