Used ACCRETECH / TSK UF 3000 #9254752 for sale

ACCRETECH / TSK UF 3000
Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9254752
Prober Chuck size, 12" Chuck: -43° to +150° Temperature unified option HiFix MHF6000: Type 3 Camera for auto needle alignment Auto needle height alignment: Auto focus GPIB TTL Double GP-IB Interface GP-IB Cable: 5m RS232C Tester: Interface cable, 5m Interface CPU SP3 connection 3-64 Die multi proving Options: Back side ID reader Ethernet I/F shade Vega computer Bar code reader: CPU SP4 Connection Type 6 cassette ID reader (OMRON V640) Needle cleaner (Ceramic stage) Brush cleaning Needle mark inspection ACCRETECH Reader (Standard) TOKEN TCD5600 Holder Index function SOAK time option Bump height settlement Wafer shape measurement by alignment camera.
ACCRETECH / TSK UF 3000 is a multi-functional prober for the semiconductor industry. It is designed to provide testing and probing capabilities for integrated circuits. TSK UF 3000 combines a general-purpose test platform with a versatile prober to accurately measure, analyze and debug a wide range of advanced devices. The prober is comprised of a probe card and a wafer stage, and is capable of handling wafers up to 10 inches in size. The wafer stage has a high-resolution CCD camera and contactless wafer adapter to ensure precise alignment of the probe card during testing. The system also supports multiple test procedures and configurations, with a wide variety of possible test patterns. The prober utilizes a differential vision enhancement system that allows for accurate contact between the probe card and the device under test. This system helps to reduce test time and improve fault location effectiveness. The prober also features a configurable test station with multiple sample holders, card sweepers and various other test equipment to make testing more efficient. To enhance data acquisition and analysis capabilities, ACCRETECH UF3000 includes an extended-mode operation for high throughput and repeatability. This helps to reduce data acquisition time and improve the accuracy of probe card misalignment. The prober also supports a variety of analog and digital signals and offers both standard and advanced testing options. The prober has the ability to accurately measure and evaluate a variety of electrical and physical properties including sheet resistance, sheet thickness, sheet metal and insulation layer thickness, film stress and probe ball contact area, among others. ACCRETECH UF 3000 also has a built-in feature for self-calibration and a user-friendly analyzer/controller interface to easily review and analyze test data. ACCRETECH / TSK UF3000 is a powerful prober designed to provide the industry with a reliable and efficient testing solution. Its advanced features, such as configurable test station, CCD camera, differential vision enhancement, and wide range of test procedures allow users to maximize their testing capabilities. UF3000 is an excellent choice for companies and research institutions that require high-speed, reliable and accurate testing and probing operations.
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