Used ACCRETECH / TSK UF 3000 #9256624 for sale

ACCRETECH / TSK UF 3000 is an automated wafer prober designed for wafer probing and production test development applications. This wafer prober is suitable for small and medium volume production sites and can handle 200 mm and 150 mm substrates. TSK UF 3000 features a unique Auto-Drill Probe Head that delivers superior repeatability and operability and allows users to quickly identify their probes and probe cards when making contact with a wafer. This wafer prober has a high throughput and offers a wide test range of up /down force, Vcc/GND, 2/4/8 electrodes, and other electrical tests. It also supports high current tests with an output current range of up to 100A. ACCRETECH UF3000 can support up to 32 chucks which can be placed in any desired combination offering high flexibility. The prober comes with a high speed linear driver and is capable of a maximum velocity of 1400mm/sec offering faster probing time. This wafer prober has an integrated table structure that is designed to improve overhead stability. Furthermore, it also has a large measurement window that allows users to optimize wafer placement on a smaller area. ACCRETECH / TSK UF3000 also comes with advanced automation functions like Auto-Processing, SEMI-S2 compliant UI, and remote management support. ACCRETECH UF 3000 features a high technical accuracy with a total positioning resolution of up to 4 μm and repeatability accuracy of 1 μm. The integrated data acquisition capability allows users to acquire wafer-level signals while measuring contact resistance or current. This wafer prober is highly efficient and uses a range of advanced technologies such as visual feedback, variable sampling rate and optimized algorithms to reduce device test time. Moreover, the wafer prober is integrated with TSK Smart Control System (or SCS) which enables test engineers to control the system from a single point. TSK UF3000 is a reliable and durable wafer prober that delivers superior performance and accuracy. It is ideal for large volume testing and production sites and can handle large wafers as well as larger test processes. The high speed linear driver and its range of advanced automation functions make this wafer prober a valuable addition to any wafer probing and production test development station.