Used ACCRETECH / TSK UF 3000 #9257590 for sale

ACCRETECH / TSK UF 3000 is a fully automated prober designed for wafer level testing of semiconductor devices. It offers high-speed wafer testing with up to 1,800 wafers per hour, and its high-precision technology achieves accurate measurement of defects in semiconductor devices. TSK UF 3000 utilizes a parallel probing technology which allows it to test multiple sites simultaneously, reducing test cycle times and improving overall quality. It also features optical identification of the wafer and die, allowing it to accurately locate and distinguish between different test sites. The prober is equipped with a number of advanced features including an upgradeable manipulation equipment, an external autostation, and advanced roll-to-roll robotic handing capabilities. The upgradeable manipulation system allows users to easily customize their prober based on their specific application needs. The external autostation requires minimal setup and can be changed quickly to accommodate for sample size and variety, while the roll-to-roll robotic handling capabilities allow testing of large quantities and multiple substrates in one setting. ACCRETECH UF3000 is also equipped with a precision measurement unit, which provides accurate test measurements with repeatable test results. The machine uses a highly sensitive vector network analyzer and a high-end frequency- and time-domain measurement module for test and fault characterization. UF 3000 is designed for use in metrology operations and automated test processes. It is equipped with a variety of software control programs that allow it to be easily integrated with automated test equipment and other systems. Its advanced features make it well-suited for a wide variety of semiconductor and other high-density applications. Overall, TSK UF3000 is a versatile prober and a powerful tool for wafer level testing of semiconductor devices. With its combination of high-speed, high-precision, and advanced features, ACCRETECH UF 3000 is an ideal choice for semiconductor metrology and automated test processes.