Used ACCRETECH / TSK UF 3000 #9268057 for sale

ACCRETECH / TSK UF 3000 is a high-precision prober equipment designed for measuring small electronic components, as well as large area substrates, such as semiconductor packages, wafers, and printed circuit boards. It can measure with a range of accuracy from one micron up to thirty microns. TSK UF 3000 is a multi-channel prober that supports several types of probe cards, including 4-wire, 2-wire, and IC chip probes. It allows for programmable accuracy and test range, allowing it to be used to measure an array of devices from very small, delicate components to devices with larger footprints. The system also includes a full range of scanning and imaging tools to measure even the most difficult-to-reach features of a package or device. It can identify short circuits, open circuits, misalignment, pin damage, alignment of pins, and other features. The unit comes equipped with a motion axis control, allowing for precise timing and motion control when probing. This, combined with the large test area, gives ACCRETECH UF3000 a much-needed edge in the precision testing areas. It is also well-suited for testing in high-volume production. The machine includes an integrated database that is used for control and data analysis, as well as data storage. The database allows for quick and easy retrieval of results, allowing for more efficient use of the prober. It also includes an integrated software package to support extensive programming capabilities for the prober. The tool also offers a wide array of testing tools, including waveform analysis, characterization, temperature testing, and digital-testing capabilities. This feature ensures that the asset can be used with all types of devices. The model is also equipped with a range of built-in safety features to protect the operators from hazards. UF3000 provides the highest degree of accuracy and precision in prober technology. It is suitable for a variety of challenging testing applications and provides an efficient solution for testing complex devices, wafers, and printed circuit boards.