Used ACCRETECH / TSK UF 3000 #9268061 for sale

ACCRETECH / TSK UF 3000 is a high performance prober designed for wafer testing and device measuring. It features a 300mm or 450mm prober chuck with a vacuum hold-down equipment to ensure secure and reliable wafer mounting. TSK UF 3000 is also designed for automated wafer probing and offers an optional air-bearing stage for accurate and repeatable wafer position throughout the probing procedure. The prober also features an Automated Wafer Inspection System (AWIS) to provide detailed wafer-level measurements. The AWIS has a two-dimensional vision unit that can detect and measure up to 64 split points along a wafer. It is also configured with a high-speed data acquisition machine that supports a wide range of electrical, thermal, acoustic, and other tests. ACCRETECH UF3000 also has a range of probing solutions for high frequency RF probing, thermal wafer probing and digital probing. Its advanced Digital Probe Station (DPS) enables fast, accurate parametric, and RF testing. The DPS is equipped with a wide range of support fixtures and capability for handling up to 10 contacts. It also features a built-in optical microscope for wafer alignment and a high-frequency module for RF probing. UF 3000 also has a full-function touch screen controller that allows users to quickly set up and easily access wafer test programs and data. The controller also allows users to select and view data from the prober or host computer, and features integrated unit sets for wafer probe measurement. The controller also stores tuning parameters, wafer test program settings, and stored data in the on-board memory. ACCRETECH / TSK UF3000 is a highly accurate and reliable prober that is ideal for high productivity wafer testing and device measurement applications. It is designed for efficient wafer probing, accurate inspection, and detailed measurements, making it an excellent choice for semiconductor device testing and production process control.