Used ACCRETECH / TSK UF 3000 #9268173 for sale
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ID: 9268173
Wafer Size: 12"
Vintage: 2005
Prober, 12"
Single side loader
Overall accuracy: Within 4 μm
Stage positioning accuracy: 2 μm / φ300 mm
Z-Axis stroke (Applicable stroke): 37 mm
Z-Axis control accuracy: ±2 μm
Stage durability: 200 kgf
Chuck type: Hot chuck
Low noise, 12"
Temperature range: +40°C to +150°C
MHF4000 Hinge and Floppy Disk Drive (FDD)
Does not include:
Chiller
Hard Disk Drive (HDD)
2005 vintage.
ACCRETECH / TSK UF 3000 Prober is a stand-alone, hybrid Wafer Prober designed for testing semiconductor components up to 6 inches in size. It features an in-built measuring equipment and a 3-axis, high-resolution stage with an adjustable positioning resolution of 0.5 µm. This prober is capable of high-speed testing of electronic components in a range of environments, as well as repeatability and accuracy. It also offers automated calibration, automatic alignment, and automatic measurement features for accurate repeatability of testing parameters. At the core of this prober is its robust, integrated digital control system with integrated, motor-driven, 3-axis stage motion, allowing TSK UF 3000 Prober to maximize the productivity within the laboratory. It also has the flexibility to be controlled either manually or from a remote PC, providing an easy-to-use interface for any testing process. The prober supports up to four measuring systems to support multiple types of tests, eliminating the need for multiple probers with dedicated tests. ACCRETECH UF3000 Prober offers up to 300 mm of wafer travel at a speed of up to 200 mm/s, providing both high-speed testing performance and precise accuracy. The wafers can be threaded into the prober's vacuum unit, allowing for sealed testing and precise wafer alignment while eliminating potential gas leakage and contamination. Its unique servo control machine also allows UF 3000 Prober to accurately position the wafer within the active area of measurement to achieve the most accurate results. UF3000 Prober also features an advanced, integrated, high-resolution imaging tool to identify flaws and defects on the wafer's surface. It is adaptable to accommodate a wide range of probes and jigs for various types of testing, and can be used in combination with the integrated Auto Alignment Asset. This allows TSK UF3000 Prober to be used for a variety of test applications, such as submicron wafer probing, LED die probing, a variety of electrical tests, nanofabrication, and atomizing. ACCRETECH / TSK UF3000 Prober is an invaluable tool for a wide variety of semiconductor manufacturing and testing environments. Its robust design and integration with the motor-driven 3-axis stage motion provide a reliable solution for accurate, repeatable testing. Its unique integrated imaging model further enhances its usability for defect identification and verification. With its considerable accuracy and repeatability, ACCRETECH UF 3000 Prober can provide precise, optimised measurements within laboratory settings and on the production floor.
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