Used ACCRETECH / TSK UF 3000 #9308941 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9308941
Wafer Size: 12"
Vintage: 2006
Wafer prober, 12" Single loadport KEYENCE BL-601HAC1 Cassette ID Reader Chuck size, 12" Chuck material: NICKEL Coating ARTS-LC12 Low temp chuck Chuck temperature range: -40~150℃ Temperature unified chuck External chiller unit: SHI SCU500S Auto probe to pad alignment Needle mark inspection Fail mark inspection Surface wafer ID OCR: Insight 1700 series Auto needle height and align: Auto / Manual card change Soak time option Probe card changer 3-64 Multi-site probing: 1~1024 ACCRETECH GPIB Interface: Standard command RS232 Interface MHF6000 Hinge manipulator Test system interface: Micron C1D (Tester is not included) Cold temperature Side loader X,Y Overall accuracy: ±2.0 µm (Temperature stability: ±1°C) X,Y Stage accuracy: ±1.0 µm Z-Axis stoke: 37 mm Z-Axis control accuracy: ±2 µm Stage durability: 200 kgf Hot and cold chuck SCU-600 Chiller Temperature range: -40ºC to 150°C No Hard Disk Drive (HDD) 2006 vintage.
ACCRETECH / TSK UF 3000 is a prober equipment designed to provide automated wafer probing and test capabilities. The system is capable of supporting up to 8 wafer probe cards simultaneously and handles wafer diameters up to 300mm with adjustable X/Y stage TABLE extensions. It is compatible with Semiconductor Process Control (SPC) to facilitate process optimization, and the integrated User Interface (UI) is designed to provide the user with the ability to easily program and monitor the automated prober unit. TSK UF 3000 features a modular design and provides an extensive list of features, such as, a unique dual stage motion machine which results in faster wafer transfer times and the ability to quickly restage the wafer under dynamic load conditions. This allows for higher throughput, improved wafer capacity and far reduces engineering times. An integrated environmental chamber also enables the tool to be used for temperature/humidity control tests and stable temperature measurements, making it ideal for testing a wide range of devices. The asset is also equipped with high-precision laser autofocus which makes it capable of managing a variety of different wafer types, from small to large samples. This allows the model to minimize mechanical probe misalignment and maximize accuracy. Additionally, the equipment incorporates a vacuum wafer clamping system for increased stability and improved repeatability. This is further optimized by an ergonomic design that provides a low uncomfortable motion range, which results in reduced fatigue and improved accuracy over continuous probing. ACCRETECH UF3000 also supports Ethernet Remote Control (ERC) functionality and SPC/EPS Waveform measurement functionality, allowing users to access and monitor the prober status and data remotely. Finally, it is compatible with a variety of operating systems, such as, Microsoft Windows, MacOS, Linux, and Android, allowing users to easily run the software required to control and monitor the unit.
There are no reviews yet