Used ACCRETECH / TSK UF 3000 #9311289 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9311289
Wafer Size: 12"
Vintage: 2005
Wafer prober, 12" 2005 vintage.
ACCRETECH / TSK UF 3000 is a high-end prober for semiconductor and integrated circuit testing, featuring a wide range of functions and options to meet the needs of researchers and engineers. It is specifically designed to provide accurate and repeatable measurements of critical dimensions on a wide range of substrates, from the smallest wafers to large devices. The prober's robust design incorporates a unique XYZ gantry platform, supporting a maximum total weight of 30 kg. The equipment is equipped with an advanced vision system, featuring 2 high-performance cameras, both with a pixel size of over 2.5 micrometers. The vision unit includes advanced features such as image capture, markers, laser triangulation, automatic measurement, and 3D coordinate mapping. It also features an intuitive graphical user interface to help users easily set parameters and monitor progress. The prober employs advanced multi-axis detection techniques, including 5-axis position detection for accurate and repeatable measurements on silicon wafers. It is also equipped with a range of probing functions for use in a variety of manufacturing environments. The probing machine includes probes for both primary and secondary layers, and supports both manual and automatic probing. TSK UF 3000 also features an integrated vector and dual-axis antenna booster to ensure optimal performance of a variety of radio frequency components, such as antennas, filters, and shields. It is designed to measure the performance of a variety of IC test structures, as well as underfill and solder bridging. The prober also incorporates a powerful LCR meter for the measurement of inductance, capacitance, and resistance of devices. The tool offers a range of data output options, including support for CSV, XML, and text files, and optional integration with a wide range of data analysis applications. It supports parallel and serial communication protocols, making it compatible with a variety of network-enabled platforms. User data can also be securely stored and retrieved via the embedded Ethernet and fiber-optic ports. In summary, ACCRETECH UF3000 is a versatile and powerful prober, capable of providing accurate and repeatable measurements of a wide range of devices. Its advanced features make it suitable for a variety of semiconductor production and research testing applications.
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