Used ACCRETECH / TSK UF 3000 #9312312 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9312312
Vintage: 2006
Wafer prober 2006 vintage.
ACCRETECH / TSK UF 3000 is a high-performance prober used for wafer probing and advanced device testing. It offers a great combination of speed and precision to evaluate the operational performance of complex devices in a timely manner. With its high-magnification objective lens and energy source, TSK UF 3000 is able to inspect multiple surfaces within a short timeframe. The objective lens on ACCRETECH UF3000 has a magnification range from 5X to 500X and features a long working distance of up to 105mm. It has a bright LED light which reduces reflected light and glare, and the hard X-Y-Z stages deliver a high-contrast imaging experience with low vibration and high accuracy. With its high-resolution image display, dynamic focus control, and adjustable working distance, ACCRETECH UF 3000 is very efficient at inspecting the details of various substrates from different angles. UF 3000 also includes a powerful field emission source of energy which can be adjusted according to the substrate's size and material. It has a closed-loop current-voltage module that can precisely measure the current parameters of dynamic probes. This enables us to obtain the electrical parameters of prototype devices, experimentally explore the electrical characteristics of new devices, and faults, and diagnose shortcomings of device testing. The measurements and testing capabilities of TSK UF3000 are controlled through an external USB port, which can also be used for data management and real-time observation of the measurement data. This enables users to monitor the device's operation from the host computer, making the process more efficient and user-friendly. UF3000 is the perfect prober for those looking for a high-performance instrument to conduct accurate tests on a range of substrates. It features a powerful energy source, high-magnification lens, and a USB port for external control. This enables users to efficiently test prototypes and diagnose faults quickly and easily.
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